User Tools
docs:become
Differences
This shows you the differences between two versions of the page.
| Both sides previous revision Previous revision Next revision | Previous revision Next revision Both sides next revision | ||
|
docs:become [2020/04/22 22:58] pklapetek |
docs:become [2020/04/22 23:02] pklapetek |
||
|---|---|---|---|
| Line 9: | Line 9: | ||
| ===== 2D calculation ===== | ===== 2D calculation ===== | ||
| - | Calculations in 2D are performed using the GSvit2D solver which is an almost unused extension of GSvit to 2D calculations. As this was very outdated, most of the algorithms had to be implemented, incuding near-to-far field calculation and various materials treatment including dispersive metal treatment via PLRC algorithm. | + | Calculations in 2D are performed using the GSvit2D solver which is an almost unused extension of GSvit to 2D calculations. As this was very outdated, most of the algorithms had to be implemented, including near-to-far field calculation and various materials treatment including dispersive metal treatment via PLRC algorithm. |
| Line 21: | Line 21: | ||
| //periodic NFFF// in the next text. | //periodic NFFF// in the next text. | ||
| In most of the graphs here we show complete diffraction pattern. | In most of the graphs here we show complete diffraction pattern. | ||
| - | However, if we are interested in the maximum in some diffraction order direction, it is much simpler and it seems that this is the preferably used approach - we calculate the far field value only at the diffraction order maximum. Luckily enough, this value is dependent on the aperture only, which constructs the envelope for the diffraction pattern, so in this case one could work only with a single aperture. However, to construct the diffraction pattern is a good way how to debug the problem. The schematics of | + | However, if we are interested in the maximum in some diffraction order direction, it is much simpler and it seems that this is the preferably used approach - we calculate the far field value only at the diffraction order maximum. Luckily enough, this value is dependent on the aperture only, which constructs the envelope for the diffraction pattern, so in this case one could work only with a single aperture. However, to calculate the whole diffraction pattern is a good way how to debug the problem. The schematics of |
| the calculations is here: | the calculations is here: | ||
| Line 58: | Line 58: | ||
| ---- | ---- | ||
| - | The transition from transition geometry to reflection geometry was done first with perfect electric conductor as a grating material. The same motive as in the Become grating is used and also | + | The transition from transmission geometry to **reflection grating** geometry was done first with **perfect electric conductor** as a grating material. The same motive as in the Become grating is used and also |
| the same voxel spacing (5 nm), it is only from a different materials for calculation speed and simplicity. All the computational details were same as in the previous example. | the same voxel spacing (5 nm), it is only from a different materials for calculation speed and simplicity. All the computational details were same as in the previous example. | ||
| To get the data normalization to the incident wave intensity we used perfect electric conductor plane only (no grating motives) and evaluated the electric field intensity in | To get the data normalization to the incident wave intensity we used perfect electric conductor plane only (no grating motives) and evaluated the electric field intensity in | ||
docs/become.txt ยท Last modified: 2020/04/24 12:27 by pklapetek
Except where otherwise noted, content on this wiki is licensed under the following license: CC Attribution-Noncommercial 4.0 International
