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--- app:thin_film [2025/02/19 10:27] – created - external edit 127.0.0.1
+++ app:thin_film [2025/02/19 14:49] (current) – admin
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 {{ :app:d_thinfilm_model.png?200|}}
-Image on the right shows scheme of the computational volume used for the simulation. As a simplest model, free standing silicon thin film (1 micrometer) was used for calculation. A normally incident plane wave was used to enter the selected wavelength into computational volume. No dispersion model was used - for every wavelength we have used directly the database values for Si_100. Absorption was evaluated locally and averaged in time from the results (using OUT_SUM directive). Transmitted and reflected intensity was evaluated using point outputs below and above thin film. These intensitites were normalized to transmitted intensity values calculated using the same model but without the film (this value was treated as incident wave intensity).
+Image on the right shows scheme of the computational volume used for the simulation. As a simplest model, free standing silicon thin film (1 µm) was used for calculation. A normally incident plane wave was used to enter the selected wavelength into computational volume. No dispersion model was used - for every wavelength we have used directly the database values for Si<sub>100</sub>. Absorption was evaluated locally and averaged in time from the results (using OUT_SUM directive). Transmitted and reflected intensity was evaluated using point outputs below and above thin film. These intensities were normalized to transmitted intensity values calculated using the same model but without the film (this value was treated as incident wave intensity).