GSvit documentation

Surface Enhanced Raman Scattering (SERS) is an advanced experimental technique for measurement of Raman scattering signals. Raman scattering itself is a process with very small yield and to measure Raman signals on some individual molecules or thin film materials is very challenging. By placing the investigated material on a special substrate we can increase the signal intensity by several orders of magnitude. The effect is based on local field enhancement

Sample parameter file: SERS.
A 300x300x300 computational domain with SERS rods